Email : Debasis@gmail.com

Address : Department of Mathematics and Statistics, Aliah University

Education

M.Sc. (Statistics), IIT Kanpur, 2009.

B.Sc. (Statistics), Asutosh College, University of Calcutta, 2007.

Teaching Experience

1. Assistant Professor, Aliah University, Kolkata (October’2017 – Present).
2. Assistant Professor, RabindraMahavidyalaya, Champadanga, Hoogly (April’2014 – October’2017).

Industrial Experience

1. Business Analyst, Genpact, Kolkata (February’2012 – March’2014).
2. Consultant Analyst, Meritus Analytics, Bangalore (September’2010 – February’2012).

Field of Specialization

Reliability Theory, Step Stress Model.

Courses Taught/Teaching

1. Sampling Distribution

2. Probability Theory

3. Design of Experiment

4. Mathematical Analysis and Linear Algebra

5. Multivariate Data Analysis

6. Engineering Mathematics

Research Area

Reliability Theory, Step Stress Model.

Journal Papers Published

1. A.Ganguly, S.Mitra, D.Samanta, D.Kundu;Exact Inference for the two-parameter exponential distribution under type-II hybrid censoring; Journal of Statistical Planning and Inference 142(3), 2012, 613-625.

2. D.Kundu, D.Samanta, A.Ganguly, S.Mitra ; Bayesian Analysis of Different Hybrid and Progressive Life Test; Communication in Statistics – Simulation and Computation  42, 2013, 2160-2173,.

3. S.Mitra, A.Ganguly, D.Samanta, D.Kundu; On Simple Step-Stress Model for two Parameter Exponential Distribution;Statistical Methodology 15, 2013, 95-114.

4. D.Samanta, A.Ganguly, D.Kundu.S.Mitra; Order Restricted Bayesian Inference for Exponential Simple Step-stress Model; Communicationin Statistics – Simulation and Computation 46(2), 2017, 1113-1135.

5. DebashisSamanta, DebasisKundu, AyonGanguly; Order Restricted Bayesian Analysis of a Simple Step Stress; Sankhya Ser. B,2017.

6. DebashisSamanta,DebasisKundu; Order Restricted Inference of a Multiple Step Stress Model; Computational Statistics and Data Analysis, 117, 2018, 62-78.

7. DebashisSamanta, Arindam Gupta, DebasisKundu; Analysis of Weibull Step Stress Model In Presence of Competing Risk; IEEE Transactions on Reliability, 2018 (to appear).